Interconnect Reliability in Advanced Memory Device Packaging is popular PDF and ePub book, written by Chong Leong, Gan in 2023-05-30, it is a fantastic choice for those who relish reading online the Computers genre. Let's immerse ourselves in this engaging Computers book by exploring the summary and details provided below. Remember, Interconnect Reliability in Advanced Memory Device Packaging can be Read Online from any device for your convenience.

Interconnect Reliability in Advanced Memory Device Packaging Book PDF Summary

This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing. In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects. This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry.

Detail Book of Interconnect Reliability in Advanced Memory Device Packaging PDF

Interconnect Reliability in Advanced Memory Device Packaging
  • Author : Chong Leong, Gan
  • Release : 30 May 2023
  • Publisher : Springer Nature
  • ISBN : 9783031267086
  • Genre : Computers
  • Total Page : 223 pages
  • Language : English
  • PDF File Size : 18,7 Mb

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