On Line Testing for VLSI is popular PDF and ePub book, written by Michael Nicolaidis in 1998-04-30, it is a fantastic choice for those who relish reading online the Computers genre. Let's immerse ourselves in this engaging Computers book by exploring the summary and details provided below. Remember, On Line Testing for VLSI can be Read Online from any device for your convenience.

On Line Testing for VLSI Book PDF Summary

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Detail Book of On Line Testing for VLSI PDF

On Line Testing for VLSI
  • Author : Michael Nicolaidis
  • Release : 30 April 1998
  • Publisher : Springer Science & Business Media
  • ISBN : 0792381327
  • Genre : Computers
  • Total Page : 166 pages
  • Language : English
  • PDF File Size : 14,5 Mb

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On Line Testing for VLSI

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