Power Constrained Testing of VLSI Circuits is popular PDF and ePub book, written by Nicola Nicolici in 2006-04-11, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Power Constrained Testing of VLSI Circuits can be Read Online from any device for your convenience.
Power Constrained Testing of VLSI Circuits Book PDF Summary
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Detail Book of Power Constrained Testing of VLSI Circuits PDF
- Author : Nicola Nicolici
- Release : 11 April 2006
- Publisher : Springer Science & Business Media
- ISBN : 9780306487316
- Genre : Technology & Engineering
- Total Page : 182 pages
- Language : English
- PDF File Size : 18,8 Mb
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