Introduction to Advanced System on Chip Test Design and Optimization is popular PDF and ePub book, written by Erik Larsson in 2006-03-30, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Introduction to Advanced System on Chip Test Design and Optimization can be Read Online from any device for your convenience.

Introduction to Advanced System on Chip Test Design and Optimization Book PDF Summary

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Detail Book of Introduction to Advanced System on Chip Test Design and Optimization PDF

Introduction to Advanced System on Chip Test Design and Optimization
  • Author : Erik Larsson
  • Release : 30 March 2006
  • Publisher : Springer Science & Business Media
  • ISBN : 9780387256245
  • Genre : Technology & Engineering
  • Total Page : 397 pages
  • Language : English
  • PDF File Size : 11,8 Mb

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