VLSI Test Principles and Architectures is popular PDF and ePub book, written by Laung-Terng Wang in 2006-08-14, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, VLSI Test Principles and Architectures can be Read Online from any device for your convenience.
VLSI Test Principles and Architectures Book PDF Summary
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Detail Book of VLSI Test Principles and Architectures PDF
- Author : Laung-Terng Wang
- Release : 14 August 2006
- Publisher : Elsevier
- ISBN : 9780080474793
- Genre : Technology & Engineering
- Total Page : 809 pages
- Language : English
- PDF File Size : 9,9 Mb
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