Noncontact Atomic Force Microscopy is popular PDF and ePub book, written by S. Morita in 2012-12-06, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Noncontact Atomic Force Microscopy can be Read Online from any device for your convenience.
Noncontact Atomic Force Microscopy Book PDF Summary
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Detail Book of Noncontact Atomic Force Microscopy PDF
- Author : S. Morita
- Release : 06 December 2012
- Publisher : Springer Science & Business Media
- ISBN : 9783642560194
- Genre : Technology & Engineering
- Total Page : 448 pages
- Language : English
- PDF File Size : 13,7 Mb
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