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Applied Scanning Probe Methods VIII Book PDF Summary

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Detail Book of Applied Scanning Probe Methods VIII PDF

Applied Scanning Probe Methods VIII
  • Author : Bharat Bhushan
  • Release : 20 December 2007
  • Publisher : Springer Science & Business Media
  • ISBN : 9783540740803
  • Genre : Technology & Engineering
  • Total Page : 465 pages
  • Language : English
  • PDF File Size : 16,9 Mb

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Applied Scanning Probe Methods VIII

Applied Scanning Probe Methods VIII Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 7,7 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods II

Applied Scanning Probe Methods II Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 15,9 Mb
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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning pr...

Applied Scanning Probe Methods IX

Applied Scanning Probe Methods IX Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 40,8 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods I

Applied Scanning Probe Methods I Author : Bharat Bhushan,Harald Fuchs,Sumio Hosaka
Publisher : Springer Science & Business Media
File Size : 55,7 Mb
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Examining the physical and technical foundation for recent progress with this technique, Applied Sca...

Applied Scanning Probe Methods XII

Applied Scanning Probe Methods XII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 32,5 Mb
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Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelect...

Applied Scanning Probe Methods X

Applied Scanning Probe Methods X Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 20,8 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 45,9 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Applied Scanning Probe Methods XIII

Applied Scanning Probe Methods XIII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 53,6 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Scanning Probe Microscopy

Scanning Probe Microscopy Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
File Size : 42,7 Mb
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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes ...