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Applied Scanning Probe Methods IV
  • Author : Bharat Bhushan
  • Release : 28 April 2006
  • Publisher : Springer Science & Business Media
  • ISBN : 9783540269144
  • Genre : Technology & Engineering
  • Total Page : 318 pages
  • Language : English
  • PDF File Size : 12,6 Mb

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Applied Scanning Probe Methods I

Applied Scanning Probe Methods I Author : Bharat Bhushan,Harald Fuchs,Sumio Hosaka
Publisher : Springer Science & Business Media
File Size : 22,8 Mb
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Examining the physical and technical foundation for recent progress with this technique, Applied Sca...

Applied Scanning Probe Methods VI

Applied Scanning Probe Methods VI Author : Bharat Bhushan,Satoshi Kawata
Publisher : Springer Science & Business Media
File Size : 13,5 Mb
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The first volume in the series was released in January 2004 and the second to fourth volumes in earl...

Applied Scanning Probe Methods IX

Applied Scanning Probe Methods IX Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 41,8 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods VIII

Applied Scanning Probe Methods VIII Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 23,9 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods II

Applied Scanning Probe Methods II Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 52,6 Mb
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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning pr...

Applied Scanning Probe Methods III

Applied Scanning Probe Methods III Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 16,5 Mb
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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning...

Applied Scanning Probe Methods XIII

Applied Scanning Probe Methods XIII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 41,6 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 16,7 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Applied Scanning Probe Methods XII

Applied Scanning Probe Methods XII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 18,5 Mb
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Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelect...