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Applied Scanning Probe Methods II Book PDF Summary

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Detail Book of Applied Scanning Probe Methods II PDF

Applied Scanning Probe Methods II
  • Author : Bharat Bhushan
  • Release : 22 June 2006
  • Publisher : Springer Science & Business Media
  • ISBN : 9783540274537
  • Genre : Technology & Engineering
  • Total Page : 456 pages
  • Language : English
  • PDF File Size : 16,6 Mb

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Applied Scanning Probe Methods VIII

Applied Scanning Probe Methods VIII Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 19,5 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods II

Applied Scanning Probe Methods II Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 18,9 Mb
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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning pr...

Applied Scanning Probe Methods III

Applied Scanning Probe Methods III Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 20,5 Mb
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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning...

Applied Scanning Probe Methods IX

Applied Scanning Probe Methods IX Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 14,9 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods I

Applied Scanning Probe Methods I Author : Bharat Bhushan,Harald Fuchs,Sumio Hosaka
Publisher : Springer Science & Business Media
File Size : 13,8 Mb
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Examining the physical and technical foundation for recent progress with this technique, Applied Sca...

Applied Scanning Probe Methods V

Applied Scanning Probe Methods V Author : Bharat Bhushan,Harald Fuchs,Satoshi Kawata
Publisher : Springer Science & Business Media
File Size : 41,8 Mb
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The volumes V, VI and VII will examine the physical and technical foundation for recent progress in ...

Applied Scanning Probe Methods VI

Applied Scanning Probe Methods VI Author : Bharat Bhushan,Satoshi Kawata
Publisher : Springer Science & Business Media
File Size : 46,5 Mb
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The first volume in the series was released in January 2004 and the second to fourth volumes in earl...

Applied Scanning Probe Methods XIII

Applied Scanning Probe Methods XIII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 51,9 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Applied Scanning Probe Methods XII

Applied Scanning Probe Methods XII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 48,9 Mb
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Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelect...