Through Silicon Vias for 3D Integration is popular PDF and ePub book, written by John H. Lau in 2012-08-05, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Through Silicon Vias for 3D Integration can be Read Online from any device for your convenience.

Through Silicon Vias for 3D Integration Book PDF Summary

A comprehensive guide to TSV and other enabling technologies for 3D integration Written by an expert with more than 30 years of experience in the electronics industry, Through-Silicon Vias for 3D Integration provides cutting-edge information on TSV, wafer thinning, thin-wafer handling, microbumping and assembly, and thermal management technologies. Applications to highperformance, high-density, low-power-consumption, wide-bandwidth, and small-form-factor electronic products are discussed. This book offers a timely summary of progress in all aspects of this fascinating field for professionals active in 3D integration research and development, those who wish to master 3D integration problem-solving methods, and anyone in need of a low-power, wide-bandwidth design and high-yield manufacturing process for interconnect systems. Coverage includes: Nanotechnology and 3D integration for the semiconductor industry TSV etching, dielectric-, barrier-, and seed-layer deposition, Cu plating, CMP, and Cu revealing TSVs: mechanical, thermal, and electrical behaviors Thin-wafer strength measurement Wafer thinning and thin-wafer handling Microbumping, assembly, and reliability Microbump electromigration Transient liquid-phase bonding: C2C, C2W, and W2W 2.5D IC integration with interposers 3D IC integration with interposers Thermal management of 3D IC integration 3D IC packaging

Detail Book of Through Silicon Vias for 3D Integration PDF

Through Silicon Vias for 3D Integration
  • Author : John H. Lau
  • Release : 05 August 2012
  • Publisher : McGraw Hill Professional
  • ISBN : 9780071785150
  • Genre : Technology & Engineering
  • Total Page : 513 pages
  • Language : English
  • PDF File Size : 21,8 Mb

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