Test and Design for Testability in Mixed Signal Integrated Circuits is popular PDF and ePub book, written by Jose Luis Huertas Díaz in 2010-02-23, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Test and Design for Testability in Mixed Signal Integrated Circuits can be Read Online from any device for your convenience.

Test and Design for Testability in Mixed Signal Integrated Circuits Book PDF Summary

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Detail Book of Test and Design for Testability in Mixed Signal Integrated Circuits PDF

Test and Design for Testability in Mixed Signal Integrated Circuits
  • Author : Jose Luis Huertas Díaz
  • Release : 23 February 2010
  • Publisher : Springer Science & Business Media
  • ISBN : 9780387235219
  • Genre : Technology & Engineering
  • Total Page : 310 pages
  • Language : English
  • PDF File Size : 10,9 Mb

If you're still pondering over how to secure a PDF or EPUB version of the book Test and Design for Testability in Mixed Signal Integrated Circuits by Jose Luis Huertas Díaz, don't worry! All you have to do is click the 'Get Book' buttons below to kick off your Download or Read Online journey. Just a friendly reminder: we don't upload or host the files ourselves.

Get Book

Fault Diagnosis of Analog Integrated Circuits

Fault Diagnosis of Analog Integrated Circuits Author : Prithviraj Kabisatpathy,Alok Barua,Satyabroto Sinha
Publisher : Springer Science & Business Media
File Size : 44,8 Mb
Get Book
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology...

Integrated Circuit Test Engineering

Integrated Circuit Test Engineering Author : Ian A. Grout
Publisher : Springer Science & Business Media
File Size : 22,9 Mb
Get Book
Using the book and the software provided with it, the reader can build his/her own tester arrangemen...

System on Chip Test Architectures

System on Chip Test Architectures Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
File Size : 40,8 Mb
Get Book
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies,...

Analog and Mixed Signal Boundary Scan

Analog and Mixed Signal Boundary Scan Author : Adam Osseiran
Publisher : Springer Science & Business Media
File Size : 19,5 Mb
Get Book
This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who de...

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
Publisher : Elsevier
File Size : 19,9 Mb
Get Book
This book is a comprehensive guide to new DFT methods that will show the readers how to design a tes...

Oscillation Based Test in Mixed Signal Circuits

Oscillation Based Test in Mixed Signal Circuits Author : Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz
Publisher : Springer Science & Business Media
File Size : 22,7 Mb
Get Book
This book presents the development and experimental validation of the structural test strategy calle...

Information Technology

Information Technology Author : Ricardo Reis
Publisher : Springer
File Size : 8,8 Mb
Get Book
This book contains a selection of tutorials on hot topics in information technology, which were pres...