Defects in SiO2 and Related Dielectrics Science and Technology is popular PDF and ePub book, written by Gianfranco Pacchioni in 2012-12-06, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Defects in SiO2 and Related Dielectrics Science and Technology can be Read Online from any device for your convenience.
Defects in SiO2 and Related Dielectrics Science and Technology Book PDF Summary
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
Detail Book of Defects in SiO2 and Related Dielectrics Science and Technology PDF
- Author : Gianfranco Pacchioni
- Release : 06 December 2012
- Publisher : Springer Science & Business Media
- ISBN : 9789401009447
- Genre : Technology & Engineering
- Total Page : 619 pages
- Language : English
- PDF File Size : 9,6 Mb
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