Bias Temperature Instability for Devices and Circuits is popular PDF and ePub book, written by Tibor Grasser in 2013-10-22, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Bias Temperature Instability for Devices and Circuits can be Read Online from any device for your convenience.
Bias Temperature Instability for Devices and Circuits Book PDF Summary
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Detail Book of Bias Temperature Instability for Devices and Circuits PDF
- Author : Tibor Grasser
- Release : 22 October 2013
- Publisher : Springer Science & Business Media
- ISBN : 9781461479093
- Genre : Technology & Engineering
- Total Page : 805 pages
- Language : English
- PDF File Size : 15,7 Mb
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