A Unified Approach for Timing Verification and Delay Fault Testing is popular PDF and ePub book, written by Mukund Sivaraman in 2012-09-17, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, A Unified Approach for Timing Verification and Delay Fault Testing can be Read Online from any device for your convenience.

A Unified Approach for Timing Verification and Delay Fault Testing Book PDF Summary

Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.

Detail Book of A Unified Approach for Timing Verification and Delay Fault Testing PDF

A Unified Approach for Timing Verification and Delay Fault Testing
  • Author : Mukund Sivaraman
  • Release : 17 September 2012
  • Publisher : Springer Science & Business Media
  • ISBN : 9781441985781
  • Genre : Technology & Engineering
  • Total Page : 164 pages
  • Language : English
  • PDF File Size : 18,5 Mb

If you're still pondering over how to secure a PDF or EPUB version of the book A Unified Approach for Timing Verification and Delay Fault Testing by Mukund Sivaraman, don't worry! All you have to do is click the 'Get Book' buttons below to kick off your Download or Read Online journey. Just a friendly reminder: we don't upload or host the files ourselves.

Get Book

Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits Author : Angela Krstic,Kwang-Ting (Tim) Cheng
Publisher : Springer Science & Business Media
File Size : 47,7 Mb
Get Book
In the early days of digital design, we were concerned with the logical correctness of circuits. We ...

A Designer s Guide to Built In Self Test

A Designer   s Guide to Built In Self Test Author : Charles E. Stroud
Publisher : Springer Science & Business Media
File Size : 50,6 Mb
Get Book
A recent technological advance is the art of designing circuits to test themselves, referred to as a...

The Best of ICCAD

The Best of ICCAD Author : Andreas Kuehlmann
Publisher : Springer Science & Business Media
File Size : 31,7 Mb
Get Book
In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversa...

Micro System Technologies 90

Micro System Technologies 90 Author : Herbert Reichl
Publisher : Springer Science & Business Media
File Size : 22,8 Mb
Get Book
On September 10-13, 1990, the first international meeting on Microsystem Technologies takes place at...