Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits is popular PDF and ePub book, written by Sandeep K. Goel in 2017-12-19, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits can be Read Online from any device for your convenience.
Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits Book PDF Summary
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Detail Book of Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits PDF
- Author : Sandeep K. Goel
- Release : 19 December 2017
- Publisher : CRC Press
- ISBN : 9781439829424
- Genre : Technology & Engineering
- Total Page : 259 pages
- Language : English
- PDF File Size : 10,7 Mb
If you're still pondering over how to secure a PDF or EPUB version of the book Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits by Sandeep K. Goel, don't worry! All you have to do is click the 'Get Book' buttons below to kick off your Download or Read Online journey. Just a friendly reminder: we don't upload or host the files ourselves.