Stochastic Process Variation in Deep Submicron CMOS is popular PDF and ePub book, written by Amir Zjajo in 2013-11-19, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Stochastic Process Variation in Deep Submicron CMOS can be Read Online from any device for your convenience.
Stochastic Process Variation in Deep Submicron CMOS Book PDF Summary
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.
Detail Book of Stochastic Process Variation in Deep Submicron CMOS PDF
- Author : Amir Zjajo
- Release : 19 November 2013
- Publisher : Springer Science & Business Media
- ISBN : 9789400777811
- Genre : Technology & Engineering
- Total Page : 207 pages
- Language : English
- PDF File Size : 18,7 Mb
If you're still pondering over how to secure a PDF or EPUB version of the book Stochastic Process Variation in Deep Submicron CMOS by Amir Zjajo, don't worry! All you have to do is click the 'Get Book' buttons below to kick off your Download or Read Online journey. Just a friendly reminder: we don't upload or host the files ourselves.