Reliability Wearout Mechanisms in Advanced CMOS Technologies is popular PDF and ePub book, written by Alvin W. Strong in 2009-10-13, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Reliability Wearout Mechanisms in Advanced CMOS Technologies can be Read Online from any device for your convenience.
Reliability Wearout Mechanisms in Advanced CMOS Technologies Book PDF Summary
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
Detail Book of Reliability Wearout Mechanisms in Advanced CMOS Technologies PDF
- Author : Alvin W. Strong
- Release : 13 October 2009
- Publisher : John Wiley & Sons
- ISBN : 9780470455258
- Genre : Technology & Engineering
- Total Page : 642 pages
- Language : English
- PDF File Size : 18,7 Mb
If you're still pondering over how to secure a PDF or EPUB version of the book Reliability Wearout Mechanisms in Advanced CMOS Technologies by Alvin W. Strong, don't worry! All you have to do is click the 'Get Book' buttons below to kick off your Download or Read Online journey. Just a friendly reminder: we don't upload or host the files ourselves.