Reliability and Radiation Effects in Compound Semiconductors is popular PDF and ePub book, written by Allan H. Johnston in 2010, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Reliability and Radiation Effects in Compound Semiconductors can be Read Online from any device for your convenience.
Reliability and Radiation Effects in Compound Semiconductors Book PDF Summary
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
Detail Book of Reliability and Radiation Effects in Compound Semiconductors PDF
- Author : Allan H. Johnston
- Release : 01 October 2024
- Publisher : World Scientific
- ISBN : 9789814277112
- Genre : Technology & Engineering
- Total Page : 376 pages
- Language : English
- PDF File Size : 20,8 Mb
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