Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices is popular PDF and ePub book, written by Ronald D Schrimpf in 2004-07-29, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices can be Read Online from any device for your convenience.
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Book PDF Summary
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Detail Book of Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices PDF
- Author : Ronald D Schrimpf
- Release : 29 July 2004
- Publisher : World Scientific
- ISBN : 9789814482158
- Genre : Technology & Engineering
- Total Page : 349 pages
- Language : English
- PDF File Size : 11,9 Mb
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