Gettering and Defect Engineering in Semiconductor Technology VIII is popular PDF and ePub book, written by Hermann G. Grimmeiss in 1999-08-11, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, Gettering and Defect Engineering in Semiconductor Technology VIII can be Read Online from any device for your convenience.

Gettering and Defect Engineering in Semiconductor Technology VIII Book PDF Summary

Ever since the invention of the transistor, a fantastic and continual growth in silicon technology has been witnessed; leading to yet more complex functions and higher densities of devices. The current book summarises the key issues of this field. Among other topics, the outlook for silicon wafer technology and silicon materials engineering in the next millennium is reviewed and new approaches to the production of a 200 GHz silicon-based devices are described. Possible applications of dislocation luminescence in silicon are discussed as well as the hopes for, and limitations of, the Si:Er - based 1.54 mm emitter. Various properties of silicon-based materials and heterojunctions are characterised by using novel and state-of-the-art measurement techniques. Hydrogen- and oxygen-related defects, rare-earth impurities as well as radiation and gettering effects are discussed from various points of view.

Detail Book of Gettering and Defect Engineering in Semiconductor Technology VIII PDF

Gettering and Defect Engineering in Semiconductor Technology VIII
  • Author : Hermann G. Grimmeiss
  • Release : 11 August 1999
  • Publisher : Trans Tech Publications Ltd
  • ISBN : 9783035706901
  • Genre : Technology & Engineering
  • Total Page : 628 pages
  • Language : English
  • PDF File Size : 14,5 Mb

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Gettering Defects in Semiconductors

Gettering Defects in Semiconductors Author : Victor A. Perevostchikov,Vladimir D. Skoupov
Publisher : Springer Science & Business Media
File Size : 24,7 Mb
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Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience...