Computed Electron Micrographs And Defect Identification is popular PDF and ePub book, written by A.K. Head in 2012-12-02, it is a fantastic choice for those who relish reading online the Computers genre. Let's immerse ourselves in this engaging Computers book by exploring the summary and details provided below. Remember, Computed Electron Micrographs And Defect Identification can be Read Online from any device for your convenience.

Computed Electron Micrographs And Defect Identification Book PDF Summary

Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.

Detail Book of Computed Electron Micrographs And Defect Identification PDF

Computed Electron Micrographs And Defect Identification
  • Author : A.K. Head
  • Release : 02 December 2012
  • Publisher : Elsevier
  • ISBN : 9780444601476
  • Genre : Computers
  • Total Page : 413 pages
  • Language : English
  • PDF File Size : 10,5 Mb

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