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Applied Scanning Probe Methods I Book PDF Summary

Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.

Detail Book of Applied Scanning Probe Methods I PDF

Applied Scanning Probe Methods I
  • Author : Bharat Bhushan
  • Release : 26 February 2014
  • Publisher : Springer Science & Business Media
  • ISBN : 9783642357923
  • Genre : Technology & Engineering
  • Total Page : 485 pages
  • Language : English
  • PDF File Size : 18,6 Mb

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Applied Scanning Probe Methods I

Applied Scanning Probe Methods I Author : Bharat Bhushan,Harald Fuchs,Sumio Hosaka
Publisher : Springer Science & Business Media
File Size : 16,6 Mb
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Examining the physical and technical foundation for recent progress with this technique, Applied Sca...

Applied Scanning Probe Methods VI

Applied Scanning Probe Methods VI Author : Bharat Bhushan,Satoshi Kawata
Publisher : Springer Science & Business Media
File Size : 38,6 Mb
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The first volume in the series was released in January 2004 and the second to fourth volumes in earl...

Applied Scanning Probe Methods IX

Applied Scanning Probe Methods IX Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 42,8 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods VIII

Applied Scanning Probe Methods VIII Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 18,6 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...

Applied Scanning Probe Methods II

Applied Scanning Probe Methods II Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 52,6 Mb
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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning pr...

Applied Scanning Probe Methods III

Applied Scanning Probe Methods III Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 50,5 Mb
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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning...

Applied Scanning Probe Methods XIII

Applied Scanning Probe Methods XIII Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 50,5 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
File Size : 44,7 Mb
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in ap...

Applied Scanning Probe Methods X

Applied Scanning Probe Methods X Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
File Size : 29,6 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in appl...