An Introduction to Logic Circuit Testing is popular PDF and ePub book, written by Parag K. Lala in 2008-11-08, it is a fantastic choice for those who relish reading online the Technology & Engineering genre. Let's immerse ourselves in this engaging Technology & Engineering book by exploring the summary and details provided below. Remember, An Introduction to Logic Circuit Testing can be Read Online from any device for your convenience.
An Introduction to Logic Circuit Testing Book PDF Summary
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Detail Book of An Introduction to Logic Circuit Testing PDF
- Author : Parag K. Lala
- Release : 08 November 2008
- Publisher : Morgan & Claypool Publishers
- ISBN : 9781598293517
- Genre : Technology & Engineering
- Total Page : 110 pages
- Language : English
- PDF File Size : 13,6 Mb
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